Great Lakes Microscopy Society Webinar Series Part 5: 4D-STEM Data Processing with Pyxem
Time:
July 23, 2026 12:00 PM EST
Abstract:
This session continues our exploration of 4D STEM, working with lazy, parallel, and out-of-memory computations. We'll focus on measuring strain and orientation from diffraction patterns, along with different methods for finding diffraction disks. We'll also cover assessing diffraction pattern quality, optimizing experimental conditions, and processing very large datasets. The goal is to introduce the methods and functionality within pyxem that extend HyperSpy for 4D STEM analysis, while showing how custom methods and workflows can be developed on top of HyperSpy.
Presenter: Dr. Carter Francis, Direct Electron
Carter Francis is a Research and Development Scientist working with Direct Electron to developing software and hardware for materials science research. He did his PhD under Prof. Paul Voyles at UW Madison. There his work was on characterization of disordered materials using 4D STEM and in situ 4D STEM. In addition to working for Direct Electron, Carter is a member of the HyperSpy steering council and is the lead developer for the 4D STEM analysis package pyxem.